preface to the reissue ofthe materials characterization series   
preface to series  
preface to the reissue of characterization of optical materials   
preface 
contributors  
introduction

part 1 influence of surfacemorphologyand
microstructure on optical response
characterization of surface roughness
1.1 introduction
1.2 whatsurfaceroughnessls
1.3 howsurfaceroughness affctsopticaimeasurements
1.4  how surface roughness and scatteringare measured
1.5  characterization ofselected surfaces
1.6  future difections

characterization of the near-surface region using poiarization-sensitive optical techniques
2.1 introduction
2.2 ellipsometry
experimentallmplementationsofellipsometry 29, analysisof
ellipsometrydata
2.3 microstructuraldeterminationsfromellipsometrydata
temperature dependence ofthe opticat properties ofsilicon   34,
determination ofthe optical functions ofglasses using se   35,
spectroscopicellipsometrystudiesofsi02/si 37, spectroscopic
ellipsometryforcomplicatedfilmstrucrures 38, time-resolved
ellipsometry 40, single-wavelengthreal-timemonitoringoffilm
growth 41, multiple-wavelengthreal-timemonitoringoffilm
growth 42, infrared ellipsometrystudies offilm growth

the composition, stoichiometry, and related microstructure of optical materials
3.1 introduction
3.2 aspectsoframanscattering
3.3  iii-vsemiconductor systems
3.4 groupivmaterials
3.5  amorphous and microcrystalline semiconductors
chalcogenideglasses 60, groupivmicrocrystallinesemiconductors
3.6 summary

diamond as an optical material
4.1 introduction
4.2 depositionmethods
4.3  0pticalpropertiesofcvd diamond
4.4  defectsin cvd diamond
4.5  polishingcvd diamond
4.6 x-raywindow
4.7 summary

part 2 stability and modification of film and surface optical properties
multijayer optical coatings
5.1 introduction
5.2 single-layeropticalcoatings
opticaiconstants 90, compositionmeasurementtechniques
5.3 multilayeropticalcoatings
compositionaianalysis 107, surfaceanalyticaitechniques 108,
microstructuralanalysis ofmultilayer optical coatings
5.4 stabilityofmultilayeropticalcoatings
5.5 future compositional and
microstructuralanalyticaitechniques

characterization and control of stress in optical films
6.1 introduction
6.2 0rigins ofstress
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